ID | 113808 |
Author |
Chan, W.M.
Osaka University
Kishimoto, T.
Osaka University
Umehara, S.
Osaka University|Tohoku University
Matsuoka, K.
Osaka University
Suzuki, K.
Wakasa Wan Energy Research Center
Yoshida, S.
Osaka University
Nakajima, K.
University of Fukui
Iida, T.
University of Tsukuba
Fushimi, Ken-Ichi
The University of Tokushima
Tokushima University Educator and Researcher Directory
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Nomachi, M.
Osaka University
Ogawa, I.
University of Fukui
Tamagawa, Y.
University of Fukui
Hazama, Ryuta
Osaka Sangyo University
Takemoto, Y.
Osaka University
Nakatani, N.
Osaka University
Takihira, Y.
Osaka University
Tozawa, M.
University of Fukui
Kakubata, H.
Osaka University
Trang, V.T.T.
Osaka University
Ohata, T.
Osaka University
Tetsuno, K.
Osaka University
Maeda, T.
Osaka University
Khai, B.T.
Osaka University
Li, X.L.
Osaka University
Batpurev, T.
Osaka University
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Content Type |
Journal Article
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Description | A low background HPGe detector system was developed at CANDLES Experimental Hall for multipurpose use. Various low background techniques were employed, including hermatic shield design, radon gas suppression, and background reduction analysis. A new pulse shape discrimination (PSD) method was specially created for coaxial Ge detector. Using this PSD method, microphonics noise and background event at low energy region less than 200 keV can be rejected effectively. Monte Carlo simulation by GEANT4 was performed to acquire the detection efficiency and study the interaction of gamma-rays with detector system. For rare decay measurement, the detector was utilized to detect the nature’s most stable isomer tantalum-180m (180Tam) decay. Two phases of tantalum physics run were completed with total livetime of 358.2 days, which Phase II has upgraded shield configuration. The world most stringent half-life limit of 180Tam has been successfully achieved.
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Journal Title |
AIP Conference Proceedings
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ISSN | 0094243X
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NCID | AA00502977
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Publisher | AIP Publishing
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Volume | 1921
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Issue | 1
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Start Page | 030004
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Published Date | 2018-01-03
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EDB ID | |
DOI (Published Version) | |
URL ( Publisher's Version ) | |
FullText File | |
language |
eng
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TextVersion |
Publisher
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departments |
Science and Technology
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