ID | 115352 |
著者 |
Shibuya, Kyuki
Tokushima University
Araki, Hiroyuki
Tokushima University
|
資料タイプ |
学術雑誌論文
|
抄録 | We propose a photon-counting (PC)-based quantitative-phase imaging (QPI) method for use in diffraction phase microscopy (DPM) that is combined with a single-pixel imaging (SPI) scheme (PC-SPI-DPM). This combination of DPM with the SPI scheme overcomes a low optical throughput problem that has occasionally prevented us from obtaining quantitative-phase images in DPM through use of a high-sensitivity single-channel photodetector such as a photomultiplier tube (PMT). The introduction of a PMT allowed us to perform PC with ease and thus solved a dynamic range problem that was inherent to SPI. As a proof-of-principle experiment, we performed a comparison study of analogue-based SPI-DPM and PC-SPI-DPM for a 125-nm-thick indium tin oxide (ITO) layer coated on a silica glass substrate. We discuss the basic performance of the method and potential future modifications of the proposed system.
|
掲載誌名 |
Japanese Journal of Applied Physics
|
ISSN | 13474065
00214922
|
cat書誌ID | AA12295836
|
出版者 | The Japan Society of Applied Physics
|
巻 | 57
|
号 | 4
|
開始ページ | 042501
|
発行日 | 2018-03-20
|
権利情報 | Content from this work may be used under the terms of the Creative Commons Attribution 4.0 license(https://creativecommons.org/licenses/by/4.0/). Any further distribution of this work must maintain attribution to the author(s) and the title of the work, journal citation and DOI.
|
EDB ID | |
出版社版DOI | |
出版社版URL | |
フルテキストファイル | |
言語 |
eng
|
著者版フラグ |
出版社版
|
部局 |
研究支援・産官学連携センター
理工学系
|