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ID 115352
Author
Shibuya, Kyuki Tokushima University
Araki, Hiroyuki Tokushima University
Content Type
Journal Article
Description
We propose a photon-counting (PC)-based quantitative-phase imaging (QPI) method for use in diffraction phase microscopy (DPM) that is combined with a single-pixel imaging (SPI) scheme (PC-SPI-DPM). This combination of DPM with the SPI scheme overcomes a low optical throughput problem that has occasionally prevented us from obtaining quantitative-phase images in DPM through use of a high-sensitivity single-channel photodetector such as a photomultiplier tube (PMT). The introduction of a PMT allowed us to perform PC with ease and thus solved a dynamic range problem that was inherent to SPI. As a proof-of-principle experiment, we performed a comparison study of analogue-based SPI-DPM and PC-SPI-DPM for a 125-nm-thick indium tin oxide (ITO) layer coated on a silica glass substrate. We discuss the basic performance of the method and potential future modifications of the proposed system.
Journal Title
Japanese Journal of Applied Physics
ISSN
13474065
00214922
NCID
AA12295836
Publisher
The Japan Society of Applied Physics
Volume
57
Issue
4
Start Page
042501
Published Date
2018-03-20
Rights
Content from this work may be used under the terms of the Creative Commons Attribution 4.0 license(https://creativecommons.org/licenses/by/4.0/). Any further distribution of this work must maintain attribution to the author(s) and the title of the work, journal citation and DOI.
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DOI (Published Version)
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language
eng
TextVersion
Publisher
departments
Center for Research Administration & Collaboration
Science and Technology