ID 110814
Author
Takegami, Kazuki Graduate School of Health Sciences, Tokushima University|Yamaguchi University Hospital
Yamada, Kenji  Tokushima University Hospital
Mihara, Yoshiki  School of Health Sciences, Tokushima University
Kimoto, Natsumi Graduate School of Health Sciences, Tokushima University
Kanazawa, Yuki Graduate School of Biomedical Sciences, Tokushima University Tokushima University Educator and Researcher Directory KAKEN Search Researchers
Higashino, Kousaku  Graduate School of Biomedical Sciences, Tokushima University|Tokushima University Hospital KAKEN Search Researchers
Yamashita, Kazuta Graduate School of Biomedical Sciences, Tokushima University|Tokushima University Hospital Tokushima University Educator and Researcher Directory
Hayashi, Fumio  Graduate School of Biomedical Sciences, Tokushima University|Tokushima University Hospital Tokushima University Educator and Researcher Directory
Okazaki, Tohru  Nagase-Landauer, Ltd.
Hashizume, Takuya  Nagase-Landauer, Ltd.
Kobayashi, Ikuo  Nagase-Landauer, Ltd.
Keywords
OSL dosimeter 
Gafchromic™ film 
Entrance surface dose 
Computed tomography 
Content Type
Journal Article
Description
Entrance surface dose (ESD) measurements are important in X-ray computed tomography (CT) for examination, but in clinical settings it is difficult to measure ESDs because of a lack of suitable dosimeters. We focus on the capability of a small optically stimulated luminescence (OSL) dosimeter. The aim of this study is to propose a practical method for using an OSL dosimeter to measure the ESD when performing a CT examination. The small OSL dosimeter has an outer width of 10 mm; it is assumed that a partial dose may be measured because the slice thickness and helical pitch can be set to various values. To verify our method, we used a CT scanner having 320 rows of detectors and checked the consistencies of the ESDs measured using OSL dosimeters by comparing them with those measured using Gafchromic™ films. The films were calibrated using an ionization chamber on the basis of half-value layer estimation. On the other hand, the OSL dosimeter was appropriately calibrated using a practical calibration curve previously proposed by our group. The ESDs measured using the OSL dosimeters were in good agreement with the reference ESDs from the Gafchromic™ films. Using these data, we also estimated the uncertainty of ESDs measured with small OSL dosimeters. We concluded that a small OSL dosimeter can be considered suitable for measuring the ESD with an uncertainty of 30 % during CT examinations in which pitch factors below 1.000 are applied.
Journal Title
Radiological Physics and Technology
ISSN
18650333
18650341
NCID
AA12236881
Publisher
Springer Japan
Volume
10
Issue
1
Start Page
49
End Page
59
Sort Key
49
Published Date
2016-06-24
Remark
Copyright © Japanese Society of Radiological Technology and Japan Society of Medical Physics 2016
The final publication is available at Springer via http://dx.doi.org/10.1007/s12194-016-0366-1.
EDB ID
URL ( Publisher's Version )
FullText File
language
eng
TextVersion
Author
departments
Medical Sciences
University Hospital