ID | 115727 |
Author |
Wang, Zhenzhen
Xi'an Jiaotong University|The University of Tokushima
Deguchi, Yoshihiro
The University of Tokushima
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Yan, Junjie
Xi'an Jiaotong University
Liu, Jiping
Xi'an Jiaotong University
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Keywords | laser-induced breakdown spectroscopy (LIBS)
laser breakdown time-of-flight mass spectrometry (LB-TOFMS)
low pressure
electron impact ionization
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Content Type |
Journal Article
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Description | The rapid and precise element measurement of trace species, such as mercury, iodine, strontium, cesium, etc. is imperative for various applications, especially for industrial needs. The elements mercury and iodine were measured by two detection methods for comparison of the corresponding detection features. A laser beam was focused to induce plasma. Emission and ion signals were detected using laser-induced breakdown spectroscopy (LIBS) and laser breakdown time-of-flight mass spectrometry (LB-TOFMS). Multi-photon ionization and electron impact ionization in the plasma generation process can be controlled by the pressure and pulse width. The effect of electron impact ionization on continuum emission, coexisting molecular and atomic emissions became weakened in low pressure condition. When the pressure was less than 1 Pa, the plasma was induced by laser dissociation and multi-photon ionization in LB-TOFMS. According to the experimental results, the detection limits of mercury and iodine in N2 were 3.5 ppb and 60 ppb using low pressure LIBS. The mercury and iodine detection limits using LB-TOFMS were 1.2 ppb and 9.0 ppb, which were enhanced due to different detection features. The detection systems of LIBS and LB-TOFMS can be selected depending on the condition of each application.
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Journal Title |
Sensors
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ISSN | 14248220
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Publisher | MDPI
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Volume | 15
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Issue | 3
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Start Page | 5982
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End Page | 6008
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Published Date | 2015-03-11
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Rights | This article is an open access article distributed under the terms and conditions of the Creative Commons Attribution license (http://creativecommons.org/licenses/by/4.0/).
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EDB ID | |
DOI (Published Version) | |
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language |
eng
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Publisher
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departments |
Science and Technology
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