ID | 110814 |
Author |
Takegami, Kazuki
Graduate School of Health Sciences, Tokushima University|Yamaguchi University Hospital
Hayashi, Hiroaki
Graduate School of Biomedical Sciences, Tokushima University
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Yamada, Kenji
Tokushima University Hospital
Mihara, Yoshiki
School of Health Sciences, Tokushima University
Kimoto, Natsumi
Graduate School of Health Sciences, Tokushima University
Kanazawa, Yuki
Graduate School of Biomedical Sciences, Tokushima University
Tokushima University Educator and Researcher Directory
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Higashino, Kousaku
Graduate School of Biomedical Sciences, Tokushima University|Tokushima University Hospital
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Yamashita, Kazuta
Graduate School of Biomedical Sciences, Tokushima University|Tokushima University Hospital
Tokushima University Educator and Researcher Directory
Hayashi, Fumio
Graduate School of Biomedical Sciences, Tokushima University|Tokushima University Hospital
Okazaki, Tohru
Nagase-Landauer, Ltd.
Hashizume, Takuya
Nagase-Landauer, Ltd.
Kobayashi, Ikuo
Nagase-Landauer, Ltd.
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Keywords | OSL dosimeter
Gafchromic™ film
Entrance surface dose
Computed tomography
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Content Type |
Journal Article
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Description | Entrance surface dose (ESD) measurements are important in X-ray computed tomography (CT) for examination, but in clinical settings it is difficult to measure ESDs because of a lack of suitable dosimeters. We focus on the capability of a small optically stimulated luminescence (OSL) dosimeter. The aim of this study is to propose a practical method for using an OSL dosimeter to measure the ESD when performing a CT examination. The small OSL dosimeter has an outer width of 10 mm; it is assumed that a partial dose may be measured because the slice thickness and helical pitch can be set to various values. To verify our method, we used a CT scanner having 320 rows of detectors and checked the consistencies of the ESDs measured using OSL dosimeters by comparing them with those measured using Gafchromic™ films. The films were calibrated using an ionization chamber on the basis of half-value layer estimation. On the other hand, the OSL dosimeter was appropriately calibrated using a practical calibration curve previously proposed by our group. The ESDs measured using the OSL dosimeters were in good agreement with the reference ESDs from the Gafchromic™ films. Using these data, we also estimated the uncertainty of ESDs measured with small OSL dosimeters. We concluded that a small OSL dosimeter can be considered suitable for measuring the ESD with an uncertainty of 30 % during CT examinations in which pitch factors below 1.000 are applied.
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Journal Title |
Radiological Physics and Technology
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ISSN | 18650333
18650341
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NCID | AA12236881
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Publisher | Springer Japan
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Volume | 10
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Issue | 1
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Start Page | 49
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End Page | 59
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Sort Key | 49
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Published Date | 2016-06-24
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Remark | Copyright © Japanese Society of Radiological Technology and Japan Society of Medical Physics 2016
The final publication is available at Springer via http://dx.doi.org/10.1007/s12194-016-0366-1. |
EDB ID | |
URL ( Publisher's Version ) | |
FullText File | |
language |
eng
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TextVersion |
Author
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departments |
Medical Sciences
University Hospital
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