ID | 110171 |
Author |
Mizuno, Takahiko
Graduate School of Science and Technology, Tokushima University
Iwata, Tetsuo
Graduate School of Science and Technology, Tokushima University
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Content Type |
Journal Article
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Description | We discuss a Hadamard-transform-based fluorescence-lifetime-imaging (HT-FLI) technique for fluorescence-lifetime-imaging microscopy (FLIM). The HT-FLI uses a Fourier-transform phase-modulation fluorometer (FT-PMF) for fluorescence-lifetime measurements, where the modulation frequency of the excitation light is swept linearly in frequency from zero to a specific maximum during a fixed duration of time. Thereafter, fluorescence lifetimes are derived through Fourier transforms for the fluorescence and reference waveforms. The FT-PMF enables the analysis of multi-component samples simultaneously. HT imaging uses electronic exchange of HT illumination mask patterns, and a high-speed, high-sensitivity photomultiplier, to eliminate frame-rate issues that accompany two-dimensional image detectors.
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Journal Title |
Optics Express
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ISSN | 10944087
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Volume | 24
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Issue | 8
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Start Page | 8202
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End Page | 8213
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Sort Key | 8202
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Published Date | 2016-04-07
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Remark | Copyright © 2016 Optical Society of America. One print or electronic copy may be made for personal use only. Systematic reproduction and distribution, duplication of any material in this paper for a fee or for commercial purposes, or modifications of the content of this paper are prohibited.
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language |
eng
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Author
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departments |
Science and Technology
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