Takegami, Kazuki Graduate School of Health Sciences, Tokushima University|Yamaguchi University Hospital
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Kimoto, Natsumi Graduate School of Health Sciences, Tokushima University
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Okazaki, Tohru Nagase-Landauer, Ltd.
Hashizume, Takuya Nagase-Landauer, Ltd.
Kobayashi, Ikuo Nagase-Landauer, Ltd.
Entrance surface dose
Entrance surface dose (ESD) measurements are important in X-ray computed tomography (CT) for examination, but in clinical settings it is difficult to measure ESDs because of a lack of suitable dosimeters. We focus on the capability of a small optically stimulated luminescence (OSL) dosimeter. The aim of this study is to propose a practical method for using an OSL dosimeter to measure the ESD when performing a CT examination. The small OSL dosimeter has an outer width of 10 mm; it is assumed that a partial dose may be measured because the slice thickness and helical pitch can be set to various values. To verify our method, we used a CT scanner having 320 rows of detectors and checked the consistencies of the ESDs measured using OSL dosimeters by comparing them with those measured using Gafchromic™ films. The films were calibrated using an ionization chamber on the basis of half-value layer estimation. On the other hand, the OSL dosimeter was appropriately calibrated using a practical calibration curve previously proposed by our group. The ESDs measured using the OSL dosimeters were in good agreement with the reference ESDs from the Gafchromic™ films. Using these data, we also estimated the uncertainty of ESDs measured with small OSL dosimeters. We concluded that a small OSL dosimeter can be considered suitable for measuring the ESD with an uncertainty of 30 % during CT examinations in which pitch factors below 1.000 are applied.
Radiological Physics and Technology
Copyright © Japanese Society of Radiological Technology and Japan Society of Medical Physics 2016
The final publication is available at Springer via http://dx.doi.org/10.1007/s12194-016-0366-1.
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