ID 110171
Author
Mizuno, Takahiko Graduate School of Science and Technology, Tokushima University
Iwata, Tetsuo Graduate School of Science and Technology, Tokushima University Tokushima University Educator and Researcher Directory KAKEN Search Researchers
Content Type
Journal Article
Description
We discuss a Hadamard-transform-based fluorescence-lifetime-imaging (HT-FLI) technique for fluorescence-lifetime-imaging microscopy (FLIM). The HT-FLI uses a Fourier-transform phase-modulation fluorometer (FT-PMF) for fluorescence-lifetime measurements, where the modulation frequency of the excitation light is swept linearly in frequency from zero to a specific maximum during a fixed duration of time. Thereafter, fluorescence lifetimes are derived through Fourier transforms for the fluorescence and reference waveforms. The FT-PMF enables the analysis of multi-component samples simultaneously. HT imaging uses electronic exchange of HT illumination mask patterns, and a high-speed, high-sensitivity photomultiplier, to eliminate frame-rate issues that accompany two-dimensional image detectors.
Journal Title
Optics Express
ISSN
10944087
Volume
24
Issue
8
Start Page
8202
End Page
8213
Sort Key
8202
Published Date
2016-04-07
Remark
Copyright © 2016 Optical Society of America. One print or electronic copy may be made for personal use only. Systematic reproduction and distribution, duplication of any material in this paper for a fee or for commercial purposes, or modifications of the content of this paper are prohibited.
EDB ID
Published Source
Optics Express (2016) Vol.24 Issue 8 p.8202-8213
URL ( Publisher's Version )
FullText File
language
eng
TextVersion
Author
departments
Science and Technology