ID | 118600 |
Author |
Kawano, Taiyoh
Tokushima University
Furuichi, Taketo
Tokushima University
Tsuchiya, Eibon
University of Tokyo
Yamaguchi, Makoto
Akita University
Okada, Tatsuya
Tokushima University
Tokushima University Educator and Researcher Directory
KAKEN Search Researchers
Kobayashi, Yohei
University of Tokyo
Tomita, Takuro
Tokushima University
Tokushima University Educator and Researcher Directory
KAKEN Search Researchers
|
Keywords | high-entropy alloys (HEAs)
Fe/Cr/Ni thin films
ultra-short pulsed laser irradiation
pulse-duration-dependence
scanning transmission electron microscopy (STEM)
element maps
|
Content Type |
Journal Article
|
Description | We examined the possibility of suppressing elemental segregation of high-entropy alloys (HEAs) using femtosecond laser irradiation. Thin films of iron (Fe), chromium (Cr), and nickel (Ni) were deposited on the surfaces of n-type SiC and p-type GaN substrates. The thicknesses of the Fe, Cr, and Ni films were 12, 7, and 11 nm, respectively. Laser irradiation was performed from the substrate side by focusing on the interface between the Fe film and substrate. Scanning transmission electron microscopy (STEM) bright-field images superimposed on the elemental maps of Fe, Cr, and Ni showed a more homogenous mixing of Fe, Cr, and Ni in the femtosecond-laser-modified region than in the picosecond-laser-modified region. In particular, the Ni distribution showed a significant improvement in homogeneity. In other words, the Ni mixture was more homogeneous in the femtosecond laser-modified region than in the picosecond laser-modified region. Although the duration of the picosecond laser pulse was sufficiently long for atomic diffusion, segregation still occurred during the cooling process following laser irradiation.
|
Journal Title |
Journal of Laser Micro/Nanoengineering
|
ISSN | 18800688
|
Publisher | Japan Laser Processing Society
|
Volume | 18
|
Issue | 2
|
Start Page | 100
|
End Page | 104
|
Published Date | 2023-09
|
EDB ID | |
DOI (Published Version) | |
URL ( Publisher's Version ) | |
FullText File | |
language |
eng
|
TextVersion |
Publisher
|
departments |
Science and Technology
|