ID | 111236 |
タイトル別表記 | Analysis of Rare and Noble Metals in Electric Devices by X-Ray Fluorescence Spectroscopy
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著者 |
Hidayanto, Eko
京都大学
河合, 潤
京都大学
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キーワード | レアメタル
貴金属
電子・電気機器
蛍光X線分析
Rare Metal
Noble Metal
Electric and Electronic Devices
X-ray Fluorescence Spectroscopy
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資料タイプ |
学術雑誌論文
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抄録 | Rare and noble metals contained in electric and electronic devices were analyzed by a commercially available energy dispersive X-ray fluorescence spectrometer. Several kinds of rare and noble metals such as nickel, cobalt, tungsten, zirconium, gold, silver, and bismuths were detected by analysis of the samples at inside part after removal of the package or crushing. Both bromine and antimony were detected in the most electronic part which contains plastics. The classification of elements contained and the procedures for identification of emission peaks in X-ray fluorescence spectrum were explained.
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掲載誌名 |
Journal of MMIJ
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ISSN | 18840450
18816118
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cat書誌ID | AA12188381
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出版者 | 一般社団法人資源・素材学会
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巻 | 124
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号 | 9
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開始ページ | 594
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終了ページ | 598
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発行日 | 2011-02-15
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権利情報 | © 2008 The Mining and Materials Processing Institute of Japan
This manuscript version is made available under the CC-BY-NC-ND 4.0 license http://creativecommons.org/licenses/by-nc-nd/4.0/ |
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言語 |
jpn
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部局 |
理工学系
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