ID | 113646 |
著者 |
水野, 孝彦
Tokushima University
Miyamoto, Shuji
Tokushima University
Ichikawa, Ryuji
Tokushima University
謝, 宜達
Tokushima University
Shibuya, Kyuki
Tokushima University
中嶋, 善晶
The University of Electro-Communications
Asahara, Akifumi
The University of Electro-Communications
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資料タイプ |
学術雑誌論文
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抄録 | Confocal laser microscopy (CLM) is a powerful tool in life science research and industrial inspection because it offers two-dimensional optical sectioning or three-dimensional imaging capability with micrometer depth selectivity. Furthermore, scan-less imaging modality enables rapid image acquisition and high robustness against surrounding external disturbances in CLM. However, the objects to be measured must be reflective, absorptive, scattering, or fluorescent because the image contrast is given by the optical intensity. If a new image contrast can be provided by the optical phase, scan-less CLMcan be further applied for transparent non-fluorescent objects or reflective objects with nanometer unevenness by providing information on refractive index, optical thickness, or geometrical shape. Here, we report scan-less confocal dual-comb microscopy offering a phase image in addition to an amplitude image with depth selectivity by using an optical frequency comb as an optical carrier of amplitude and phase with discrete ultra-multichannels. Our technique encodes confocal amplitude and phase images of a sample onto a series of discrete modes in the optical frequency comb with well-defined amplitude and phase to establish a one-to-one correspondence between image pixels and comb modes. The technique then decodes these images from comb modes with amplitude and phase. We demonstrate confocal phase imaging with milliradian phase resolution under micrometer depth selectivity on the millisecond timescale. As a proof of concept, we demonstrate the quantitative phase imaging of standing culture fixed cells and the surface topography of nanometer-scale step structures. Our technique for confocal phase imaging will find applications in three-dimensional visualization of stacked living cells in culture and nanometer surface topography of semiconductor objects.
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掲載誌名 |
Optica
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ISSN | 23342536
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出版者 | OSA publishing
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巻 | 5
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号 | 5
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開始ページ | 634
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終了ページ | 643
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発行日 | 2018-05-16
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権利情報 | This is an open access article distributed under a Creative Commons license(https://creativecommons.org/licenses/by/4.0/).
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EDB ID | |
出版社版DOI | |
出版社版URL | |
フルテキストファイル | |
言語 |
eng
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著者版フラグ |
出版社版
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部局 |
理工学系
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