ID | 115237 |
著者 |
Fermann, M. E.
IMRA America Inc.
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資料タイプ |
学術雑誌論文
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抄録 | Low phase noise frequency synthesizers are of paramount interest in many areas of micro-mm wave technology, encompassing for example advanced wireless communication, radar, radio-astronomy, and precision instrumentation. Although this broad research field is not bereft of methods for the generation of either low phase noise micro- or mm waves, no universal system applicable to low phase noise generation for micro and mm waves has yet been demonstrated. Here we propose a new photonic frequency discriminator based on a two wavelength delayed self-heterodyne interferometer which is compatible with such an objective. The photonic frequency discriminator can be a reference both for micro and mm waves to lower their phase noise. As a proof-of-concept, we demonstrate a low phase noise tunable OEO (6–18 GHz) and locking of a heterodyne beat between two cw lasers (10–400 GHz) with low relative phase noise. The required components for the photonic frequency discriminator are off-the-shelf and can be readily assembled. We believe this new type of photonic frequency discriminator will enable a new generation of universal precision tunable sources for the X, K, V, W and mm-bands and beyond.
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掲載誌名 |
Scientific Reports
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ISSN | 20452322
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出版者 | Springer Nature
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巻 | 8
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開始ページ | 13719
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発行日 | 2018-09-12
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権利情報 | This article is licensed under a Creative Commons Attribution 4.0 International License, which permits use, sharing, adaptation, distribution and reproduction in any medium or format, as long as you give appropriate credit to the original author(s) and the source, provide a link to the Creative Commons license, and indicate if changes were made. The images or other third party material in this article are included in the article’s Creative Commons license, unless indicated otherwise in a credit line to the material. If material is not included in the article’s Creative Commons license and your intended use is not permitted by statutory regulation or exceeds the permitted use, you will need to obtain permission directly from the copyright holder. To view a copy of this license, visit http://creativecommons.org/licenses/by/4.0/
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言語 |
eng
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部局 |
ポストLEDフォトニクス研究所
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