| ID | 110900 |
| Author |
Kobayashi, Keisuke
The University of Tokushima
Tanabe, Shinichi
NTT Basic Research Laboratories, NTT Corporation
Tao, Takuto
The University of Tokushima
Okumura, Toshio
The University of Tokushima
Nakashima, Takeshi
The University of Tokushima
Aritsuki, Takuya
The University of Tokushima
O, Ryong-Sok
The University of Tokushima
Nagase, Masao
The University of Tokushima
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|
| Content Type |
Journal Article
|
| Description | The electronic transport of epitaxial graphene on silicon carbide is anisotropic because of the anisotropy of the surface structure of the substrate. In this Letter, we present a new method for measuring anisotropic transport based on the van der Pauw method. This method can measure anisotropic transport on the macroscopic scale without special equipment or device fabrication. We observe an anisotropic resistivity with a ratio of maximum to minimum of 1.62. The calculated maximum mobility is 2876cm2·V-1·s-1, which is 1.43 times higher than that obtained by the standard van der Pauw method.
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| Journal Title |
Applied Physics Express
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| ISSN | 18820786
18820778
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| NCID | AA12295133
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| Publisher | The Japan Society of Applied Physics
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| Volume | 8
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| Issue | 3
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| Start Page | 036602
|
| Sort Key | 036602
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| Published Date | 2015-02-26
|
| Remark | © 2015 The Japan Society of Applied Physics
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| EDB ID | |
| URL ( Publisher's Version ) | |
| FullText File | |
| language |
eng
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| TextVersion |
Author
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| departments |
Science and Technology
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