ID 110900
Author
Kobayashi, Keisuke The University of Tokushima
Tanabe, Shinichi NTT Basic Research Laboratories, NTT Corporation
Tao, Takuto The University of Tokushima
Okumura, Toshio The University of Tokushima
Nakashima, Takeshi The University of Tokushima
Aritsuki, Takuya The University of Tokushima
O, Ryong-Sok The University of Tokushima
Content Type
Journal Article
Description
The electronic transport of epitaxial graphene on silicon carbide is anisotropic because of the anisotropy of the surface structure of the substrate. In this Letter, we present a new method for measuring anisotropic transport based on the van der Pauw method. This method can measure anisotropic transport on the macroscopic scale without special equipment or device fabrication. We observe an anisotropic resistivity with a ratio of maximum to minimum of 1.62. The calculated maximum mobility is 2876cm2·V-1·s-1, which is 1.43 times higher than that obtained by the standard van der Pauw method.
Journal Title
Applied Physics Express
ISSN
18820786
18820778
NCID
AA12295133
Publisher
The Japan Society of Applied Physics
Volume
8
Issue
3
Start Page
036602
Sort Key
036602
Published Date
2015-02-26
Remark
© 2015 The Japan Society of Applied Physics
EDB ID
URL ( Publisher's Version )
FullText File
language
eng
TextVersion
Author
departments
Science and Technology