ID | 105974 |
Title Transcription | グラフェン フクゴウ ブッセイ ノ キノウ デバイスカ ギジュツ ノ ケンキュウ
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Title Alternative | Study on Graphene Composite Properties for New Functional Devices
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Author |
Nagase, Masao
Institute of Technology and Science, The University of Tokushima
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Keywords | Graphene
SiC
Raman spectroscopy
Scanning probe microscopy
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Content Type |
Departmental Bulletin Paper
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Description | This study describes formation and evaluation techniques of graphene on SiC for new functional devices using composite properties. A new layer number determination technique for graphene on SiC was established using microscopic Raman spectroscopy. Growth mechanism of graphene was revealed by detailed image analysis of scanning probe microscopy (SPM). Highly uniform single-layer single-crystal graphene was successfully grown on SiC substrate of 10 mm-sq size. New methods for mechanical and electrical properties of graphene were also developed. Friction force of graphene on SiC was evaluated using friction force microscopy. Contact conductance properties were measured using conductive nanoprobes on SPM.
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Journal Title |
徳島大学大学院ソシオテクノサイエンス研究部研究報告
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ISSN | 21859094
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NCID | AA12214889
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Volume | 58
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Start Page | 13
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End Page | 21
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Sort Key | 13
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Published Date | 2013
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EDB ID | |
FullText File | |
language |
jpn
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TextVersion |
Publisher
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departments |
Science and Technology
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