ID | 105974 |
タイトルヨミ | グラフェン フクゴウ ブッセイ ノ キノウ デバイスカ ギジュツ ノ ケンキュウ
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タイトル別表記 | Study on Graphene Composite Properties for New Functional Devices
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著者 | |
キーワード | Graphene
SiC
Raman spectroscopy
Scanning probe microscopy
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資料タイプ |
紀要論文
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抄録 | This study describes formation and evaluation techniques of graphene on SiC for new functional devices using composite properties. A new layer number determination technique for graphene on SiC was established using microscopic Raman spectroscopy. Growth mechanism of graphene was revealed by detailed image analysis of scanning probe microscopy (SPM). Highly uniform single-layer single-crystal graphene was successfully grown on SiC substrate of 10 mm-sq size. New methods for mechanical and electrical properties of graphene were also developed. Friction force of graphene on SiC was evaluated using friction force microscopy. Contact conductance properties were measured using conductive nanoprobes on SPM.
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掲載誌名 |
徳島大学大学院ソシオテクノサイエンス研究部研究報告
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ISSN | 21859094
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cat書誌ID | AA12214889
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巻 | 58
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開始ページ | 13
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終了ページ | 21
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並び順 | 13
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発行日 | 2013
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EDB ID | |
フルテキストファイル | |
言語 |
jpn
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著者版フラグ |
出版社版
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部局 |
理工学系
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