| ID | 110900 |
| 著者 |
Kobayashi, Keisuke
The University of Tokushima
Tanabe, Shinichi
NTT Basic Research Laboratories, NTT Corporation
Tao, Takuto
The University of Tokushima
Okumura, Toshio
The University of Tokushima
Nakashima, Takeshi
The University of Tokushima
Aritsuki, Takuya
The University of Tokushima
O, Ryong-Sok
The University of Tokushima
|
| 資料タイプ |
学術雑誌論文
|
| 抄録 | The electronic transport of epitaxial graphene on silicon carbide is anisotropic because of the anisotropy of the surface structure of the substrate. In this Letter, we present a new method for measuring anisotropic transport based on the van der Pauw method. This method can measure anisotropic transport on the macroscopic scale without special equipment or device fabrication. We observe an anisotropic resistivity with a ratio of maximum to minimum of 1.62. The calculated maximum mobility is 2876cm2·V-1·s-1, which is 1.43 times higher than that obtained by the standard van der Pauw method.
|
| 掲載誌名 |
Applied Physics Express
|
| ISSN | 18820786
18820778
|
| cat書誌ID | AA12295133
|
| 出版者 | The Japan Society of Applied Physics
|
| 巻 | 8
|
| 号 | 3
|
| 開始ページ | 036602
|
| 並び順 | 036602
|
| 発行日 | 2015-02-26
|
| 備考 | © 2015 The Japan Society of Applied Physics
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| EDB ID | |
| 出版社版URL | |
| フルテキストファイル | |
| 言語 |
eng
|
| 著者版フラグ |
著者版
|
| 部局 |
理工学系
|
