| ID | 118242 |
| Title Alternative | Built-in Electrical Interconnect Test Circuits for Open Defect Detection Based on Supply Current
|
| Author |
Kanda, Michiya
|
| Keywords | electrical test
interconnect test
open defect
testable design
design for testability
|
| Content Type |
Thesis or Dissertation
|
| Published Date | 2023-03-06
|
| Remark | 内容要旨・審査要旨・論文要約の公開
論文本文は2025-08-31以降公開予定 |
| FullText File | |
| language |
jpn
|
| TextVersion |
その他
|
| MEXT report number | 甲第3682号
|
| Diploma Number | 甲先第442号
|
| Granted Date | 2023-03-06
|
| Degree Name |
Doctor of Engineering
|
| Grantor |
Tokushima University
|
